The dataset consist of the high energy x ray diffraction data collected at Argonne National Laboratory at temperatures 85K, 95K, 105K, 120K, 200K, 250K, and 300K for NdPt2Si2 and PrPt2Si2. The file format is two columns text file. The analysis on this system has been completed and ready for the publication, so the purpose for this data set as requirement of journal is to make this experimental raw data available.